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X-ray free-electron laser based dark-field X-ray microscopy: a simulation-based study

Authors :
Theodor Secanell Holstad
Trygve Magnus Ræder
Mads Carlsen
Erik Bergbäck Knudsen
Leora Dresselhaus-Marais
Kristoffer Haldrup
Hugh Simons
Martin Meedom Nielsen
Henning Friis Poulsen
Source :
Journal of Applied Crystallography. 55:112-121
Publication Year :
2022
Publisher :
International Union of Crystallography (IUCr), 2022.

Abstract

Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three-dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In this work, the feasibility of DFXM at the picosecond time scale using an X-ray free-electron laser source and a pump–probe scheme is considered. Thermomechanical strain-wave simulations are combined with geometrical optics and wavefront propagation optics to simulate DFXM images of phonon dynamics in a diamond single crystal. Using the specifications of the XCS instrument at the Linac Coherent Light Source as an example results in simulated DFXM images clearly showing the propagation of a strain wave.

Details

ISSN :
16005767
Volume :
55
Database :
OpenAIRE
Journal :
Journal of Applied Crystallography
Accession number :
edsair.doi...........49572095cf4cd8840e7c5ad8ddc7e69c
Full Text :
https://doi.org/10.1107/s1600576721012760