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X-ray free-electron laser based dark-field X-ray microscopy: a simulation-based study
- Source :
- Journal of Applied Crystallography. 55:112-121
- Publication Year :
- 2022
- Publisher :
- International Union of Crystallography (IUCr), 2022.
-
Abstract
- Dark-field X-ray microscopy (DFXM) is a nondestructive full-field imaging technique providing three-dimensional mapping of microstructure and local strain fields in deeply embedded crystalline elements. This is achieved by placing an objective lens in the diffracted beam, giving a magnified projection image. So far, the method has been applied with a time resolution of milliseconds to hours. In this work, the feasibility of DFXM at the picosecond time scale using an X-ray free-electron laser source and a pump–probe scheme is considered. Thermomechanical strain-wave simulations are combined with geometrical optics and wavefront propagation optics to simulate DFXM images of phonon dynamics in a diamond single crystal. Using the specifications of the XCS instrument at the Linac Coherent Light Source as an example results in simulated DFXM images clearly showing the propagation of a strain wave.
- Subjects :
- Physics::Optics
General Biochemistry, Genetics and Molecular Biology
Subjects
Details
- ISSN :
- 16005767
- Volume :
- 55
- Database :
- OpenAIRE
- Journal :
- Journal of Applied Crystallography
- Accession number :
- edsair.doi...........49572095cf4cd8840e7c5ad8ddc7e69c
- Full Text :
- https://doi.org/10.1107/s1600576721012760