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Front Matter: Volume 8729

Authors :
Tim K. Maugel
Dale E. Newbury
Michael T. Postek
S. Frank Platek
Source :
Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences.
Publication Year :
2013
Publisher :
SPIE, 2013.

Details

ISSN :
0277786X
Database :
OpenAIRE
Journal :
Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Accession number :
edsair.doi...........490045ec6643cfef3d30620eec5edfdf
Full Text :
https://doi.org/10.1117/12.2031983