Spectral analysis of the IEC waveform, a comparison of generators and pulsers

The IEC 61000-4-2 is a system level test, yet original equipment manufacturers (OEMs) continually ask the IC manufactures to test components with this waveform. The main problem to testing components to the IEC 61000-4-2 is that qualified generators (sometimes referenced as an IEC gun) produce different results for RF sensitive components. This work analyzes the frequency domain spectra to demonstrate why the IEC generators are not repeatable across equipment. In addition, it analyzes an IEC pulser's waveform to show the well-controlled spectrum and the repeatability from event to event which is something the generators lack. Using equipment that is repeatable is essential to get meaningful results across sites, especially for RF components.