FRONT MATTER

Authors :: Richard Haight
Frances M Ross
James B Hannon
Source :: Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization. :i-xxiv
Publication Year :: 2011
Publisher :: World Scientific Publishing Company, 2011.

ISSN :: 2335660X and 23356596
Database :: OpenAIRE
Journal :: Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization
Accession number :: edsair.doi...........48476632fee15e7bbc4b837c16995115
Full Text :: https://doi.org/10.1142/9789814322843_fmatter