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High-temperature GaN/SiC heterojunction bipolar transistor with high gain

Authors :
Jacques I. Pankove
S.S. Chang
Theodore D. Moustakas
H.C. Lee
R.J. Molnar
B. Van Zeghbroeck
Source :
Proceedings of 1994 IEEE International Electron Devices Meeting.
Publication Year :
2002
Publisher :
IEEE, 2002.

Abstract

A new high temperature heterojunction bipolar transistor (HBT) with a current gain as high as 100,000 has been fabricated. This HBT utilizes GaN for the emitter and SiC for the base and collector. The devices exhibit near ideal current-voltage characteristics, as demonstrated by their high current gain along with the absence of any observable Early effect, with the exception of high leakage currents at voltages above 10 V. High temperature operation has been demonstrated up to 260/spl deg/C with minimal degradation in output, except for an increase in leakage currents. >

Details

Database :
OpenAIRE
Journal :
Proceedings of 1994 IEEE International Electron Devices Meeting
Accession number :
edsair.doi...........47758fc5e061ff2e804553b3ce3229a1
Full Text :
https://doi.org/10.1109/iedm.1994.383385