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Measuring the linearity of X-ray detectors: consequences for absolute attenuation, scattering and absolute Bragg intensities

Authors :
Christopher T. Chantler
Mark W. Grigg
M. Tauhidul Islam
Chanh Q. Tran
Zwi Barnea
Nicholas A. Rae
Jack L. Glover
Martin D. de Jonge
Source :
Journal of Applied Crystallography. 44:281-286
Publication Year :
2011
Publisher :
International Union of Crystallography (IUCr), 2011.

Abstract

The linearity of response of X-ray detectors is tested. Examples of linearity tests demonstrate the remarkable range of linear response of flowing-gas ion chambers in the synchrotron environment. The diagnostic is also highly sensitive to the presence in the X-ray beam of harmonic X-rays diffracted by a higher-order reflection of the monochromator. The remarkable range of linearity of ion chambers has enabled the accurate measurement of the absolute X-ray attenuation of a number of elements. It should now be possible to measure the absolute intensity of Bragg reflections, provided such measurements are carried out with extended-face single crystals. The advantages of the extended-face crystal technique for Bragg intensity measurements are summarized and a number of approaches to absolute Bragg intensity measurement are discussed. © 2011 International Union of Crystallography Printed in Singapore - all rights reserved.

Details

ISSN :
00218898
Volume :
44
Database :
OpenAIRE
Journal :
Journal of Applied Crystallography
Accession number :
edsair.doi...........46bcdf780be95fd9d5379feac9632c4f