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Properties and Characterization Methods

Authors :
Michael T. Taschuk
Michael J. Brett
Matthew M. Hawkeye
Source :
Glancing Angle Deposition of Thin Films ISBN: 9781118847510, Glancing Angle Deposition of Thin Films: Engineering the Nanoscale
Publication Year :
2014
Publisher :
John Wiley & Sons, Ltd, 2014.

Subjects

Subjects :
Materials science
Characterization methods
Surface roughness
Scanning confocal electron microscopy
Analytical chemistry
Energy filtered transmission electron microscopy
Nanotechnology
Sample preparation
Porosimetry

Details

ISBN :
978-1-118-84751-0
ISBNs :
9781118847510
Database :
OpenAIRE
Journal :
Glancing Angle Deposition of Thin Films ISBN: 9781118847510, Glancing Angle Deposition of Thin Films: Engineering the Nanoscale
Accession number :
edsair.doi...........4695c0f7f492093a12e7c5300ffa130a
Full Text :
https://doi.org/10.1002/9781118847510.ch4
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