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An Efficient Stress Pattern Based on VMRQ-PRBS for DDR Training

Authors :
Xiuqin Chu
Jun Wang
Kailin Li
Ruonan Wang
Yang Liu
Source :
IEEE Transactions on Electromagnetic Compatibility. 64:2218-2226
Publication Year :
2022
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2022.

Subjects

Subjects :
Electrical and Electronic Engineering
Condensed Matter Physics
Atomic and Molecular Physics, and Optics

Details

ISSN :
1558187X and 00189375
Volume :
64
Database :
OpenAIRE
Journal :
IEEE Transactions on Electromagnetic Compatibility
Accession number :
edsair.doi...........4656a164666a40ab9292629130c56f41
Full Text :
https://doi.org/10.1109/temc.2022.3210574
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