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Modeling the temperature distribution of multi-chip integrated circuits combining Wire-Bond and Flip-Chip technologies

Authors :
P N Seredov
N. Yu. Ershova
P. P. Boriskov
Vadim Putrolaynen
Maksim Belyaev
Source :
Journal of Physics: Conference Series. 1399:022036
Publication Year :
2019
Publisher :
IOP Publishing, 2019.

Abstract

On the basis of finite-element computer modeling, the temperature distribution of a multi-chip integrated circuit was calculated in System on Package configuration, combining Wire-Bond and Flip-Chip technologies. Technical recommendations are suggested for choosing a compound, taking into account the continuous layer of the compound separating the active elements and the heat sink.

Details

ISSN :
17426596 and 17426588
Volume :
1399
Database :
OpenAIRE
Journal :
Journal of Physics: Conference Series
Accession number :
edsair.doi...........463d3d12183e5b44cf441cd9ac2e02b5