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XPS, EPMA and microstructural analysis of a defective industrial plasma-nitrided steel
- Source :
- Surface and Coatings Technology. 202:5887-5894
- Publication Year :
- 2008
- Publisher :
- Elsevier BV, 2008.
-
Abstract
- A multiple analysis of a defective nitrided case has been used to investigate different parts of the over layer region. Experiments by means of X-ray photoelectron spectroscopy (XPS), electron probe microanalysis (EPMA), light microscopy and microhardness measurements were done at different scales and information was given on the structural and physico-chemical properties. The metallographic study allowed estimating the nitrided case depth together with hardness and nitrogen concentration profiles in depth. Also, the irregular nitrogen concentration and the irregular hardness profiles, in a parallel direction to the surface, were correlated with the structure features in the nitrided sample cross-section. One can notice a reasonable connection among the different results, which gives a good understanding of the defective nitrided sample.
- Subjects :
- Materials science
Metallurgy
Analytical chemistry
chemistry.chemical_element
Surfaces and Interfaces
General Chemistry
Electron microprobe
Condensed Matter Physics
Microstructure
Nitrogen
Indentation hardness
Surfaces, Coatings and Films
chemistry
X-ray photoelectron spectroscopy
Microscopy
Materials Chemistry
Layer (electronics)
Nitriding
Subjects
Details
- ISSN :
- 02578972
- Volume :
- 202
- Database :
- OpenAIRE
- Journal :
- Surface and Coatings Technology
- Accession number :
- edsair.doi...........45f18e8c3256aed2f44be608a8022858