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Plant-wide Process Fine-scale Monitoring via Distributed Static Magnitude-Dynamic Difference
- Source :
- IEEE Transactions on Industrial Informatics. :1-8
- Publication Year :
- 2023
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2023.
Details
- ISSN :
- 19410050 and 15513203
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Industrial Informatics
- Accession number :
- edsair.doi...........45f0ae788f608c8faa221871d462b2cd
- Full Text :
- https://doi.org/10.1109/tii.2023.3241680