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Spatial resolution of electron probe X-ray microanalysis on sections of organic (biological) material

Authors :
M. Felsmann
A. Recker
E. R. Krefting
Ludwig Reimer
B. Feja
Hans-Jürgen Höhling
Rudolf Reichelt
Source :
Ultramicroscopy. 77:13-21
Publication Year :
1999
Publisher :
Elsevier BV, 1999.

Abstract

A locally enhanced element concentration influences the result of an X-ray microanalysis at a neighbouring position. This influence was investigated for the first time systematically in organic (biological) material using sections of epoxy resin (thickness 0.5–2.5 μm) containing a layer of pure gold. Wavelength and energy dispersive spectrometers were applied to analyse the X-rays generated by 15–35 keV electrons. Characteristic X-rays could be detected up to distances of several μm from the gold layer. For example, for a 2.4 μm thick section and 35 keV electrons the measured apparent gold concentration was above 0.1% (weight% per dry mass) at a distance of 10 μm. Thus, the lateral resolution may be not better than a multiple of the section thickness. The apparent gold concentration at a given distance is proportional to the specimen thickness and increases with increasing electron energy. Monte Carlo simulations confirm the experimental results. The influence of a local enrichment depends on the particular specimen properties (e.g. thickness, density, mean atomic number), the electron energy, and the geometry of the detector with respect to the specimen.

Details

ISSN :
03043991
Volume :
77
Database :
OpenAIRE
Journal :
Ultramicroscopy
Accession number :
edsair.doi...........45a118669fe9fdb9c81529235a609e1f
Full Text :
https://doi.org/10.1016/s0304-3991(99)00005-4