Avoiding Parasitic Current Flow Through Point Contacts in Test Structures for QSSPC Contact Recombination Current Measurements

Authors :: Robert Mertens
Jan Deckers
Ivan Gordon
Maarten Debucquoy
Jef Poortmans
Source :: IEEE Journal of Photovoltaics. 5:276-281
Publication Year :: 2015
Publisher :: Institute of Electrical and Electronics Engineers (IEEE), 2015.

Subjects :: Materials science
business.industry
Flow (psychology)
Optoelectronics
Point (geometry)
Electrical and Electronic Engineering
Current (fluid)
Condensed Matter Physics
business
Recombination current
Electronic, Optical and Magnetic Materials

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