Back to Search Start Over

Electroluminescence at a wavelength of 1.5 μm in Si:Er/Si diode structures doped with Al, Ga, and B acceptors

Authors :
V. B. Shmagin
K. E. Kudryavtsev
M. O. Marychev
Boris A. Andreev
O. N. Gorshkov
M. V. Kuznetsov
V. P. Kuznetsov
Z. F. Krasilnik
A. V. Kornaukhov
Source :
Semiconductors. 44:1597-1599
Publication Year :
2010
Publisher :
Pleiades Publishing Ltd, 2010.

Abstract

Si:Er layers in diode structures were doped with Al, Ga, or B during growth by sublimation molecular-beam epitaxy. As a result, a sharp increase in the electroluminescence intensity at a wavelength of 1.5 μm was observed in diodes with thick bases (as large as 0.8 μm).

Details

ISSN :
10906479 and 10637826
Volume :
44
Database :
OpenAIRE
Journal :
Semiconductors
Accession number :
edsair.doi...........442960b6158538d9dfdf3ec48cb131de
Full Text :
https://doi.org/10.1134/s1063782610120110