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Field-effect induced modulation of conduction in Langmuir-Blodgett films of ethylenedithiotetrathiofulvalene derivatives

Authors :
P. Hesto
L. Aguilhon
G. Tremblay
A. Barraud
Michel Vandevyver
Jean-Philippe Bourgoin
Source :
Thin Solid Films. 242:7-10
Publication Year :
1994
Publisher :
Elsevier BV, 1994.

Abstract

Field effect transistors have been made, the channels of which consist of conducting, iodine-doped Langmuir-Blodgett (LB) films. In the chosen configuration, the modulation effect is shown to arise mostly from the source-channel contact, which behaves as a reverse-biased Schottky diode. The gate voltage modulates the height of the diode barrier by controlling the surface charge density of the oxide-LB film interface states. This model explains qualitatively and quantitatively the behaviour of the transistor and gives rise to remarkably good fits with the experimental transistor characteristics. The model is also supported by a counterexperiment in which the source and drain contacts are ohmic, as expected this leads to almost no drain current modulation.

Details

ISSN :
00406090
Volume :
242
Database :
OpenAIRE
Journal :
Thin Solid Films
Accession number :
edsair.doi...........42417042fac76bc4a10425ea25b06089
Full Text :
https://doi.org/10.1016/0040-6090(94)90492-8