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Structural and Electronic Properties of Ti Doped ZnO: XRD, TEM, EELS and Ab-initio Simulations
- Source :
- Microscopy and Microanalysis. 23:1686-1687
- Publication Year :
- 2017
- Publisher :
- Oxford University Press (OUP), 2017.
Details
- ISSN :
- 14358115 and 14319276
- Volume :
- 23
- Database :
- OpenAIRE
- Journal :
- Microscopy and Microanalysis
- Accession number :
- edsair.doi...........403e6c72b8d8f0a1360155c69cfa9d01
- Full Text :
- https://doi.org/10.1017/s1431927617009096