High Resolution Microscopy with Single Atom Sensitivity using Aberration-Corrected STEM

Authors :: Cristian I. Contescu
K. van Benthem
Gayle S. Painter
Stephen J. Pennycook
Nidia C. Gallego
Paul F. Becher
Source :: Microscopy and Microanalysis. 13
Publication Year :: 2007
Publisher :: Oxford University Press (OUP), 2007.

Subjects :: Materials science
Microscopy
High resolution
Atom (order theory)
Sensitivity (control systems)
Instrumentation
Molecular physics

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