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FDR Test Compression Algorithm based on Frequency-ordered

Authors :
Sung-Ju Park
Dooyoung Kim
Changmin Mun
Source :
Journal of the Institute of Electronics and Information Engineers. 51:106-113
Publication Year :
2014
Publisher :
The Institute of Electronics Engineers of Korea, 2014.

Details

ISSN :
22875026
Volume :
51
Database :
OpenAIRE
Journal :
Journal of the Institute of Electronics and Information Engineers
Accession number :
edsair.doi...........3fbf1a11b2d37cfa68c130f4613855b1
Full Text :
https://doi.org/10.5573/ieie.2014.51.5.106