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Electronic transport mechanism and defect states for p-InP/i-InGaAs/n-InP photodiodes

Authors :
Thi Kim Oanh Vu
Minh Tien Tran
Nguyen Xuan Tu
Nguyen Thi Thanh Bao
Eun Kyu Kim
Source :
Journal of Materials Research and Technology. 19:2742-2749
Publication Year :
2022
Publisher :
Elsevier BV, 2022.

Details

ISSN :
22387854
Volume :
19
Database :
OpenAIRE
Journal :
Journal of Materials Research and Technology
Accession number :
edsair.doi...........3f70ca0eb83a7c1759a8b902017e2317