Vibration-resistant interference microscope with assistant focusing for on-machine measurement of surface topography

MLA

Kaihua Cui, et al. “Vibration-Resistant Interference Microscope with Assistant Focusing for on-Machine Measurement of Surface Topography.” Precision Engineering, vol. 66, Nov. 2020, pp. 220–28. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........3edb7a420e6abc6b368e596a2001f218&authtype=sso&custid=ns315887.

APA

Kaihua Cui, Zhang Hui, Huang Xiaojin, Yue Xiaobin, Liu Qian, & Li Lulu. (2020). Vibration-resistant interference microscope with assistant focusing for on-machine measurement of surface topography. Precision Engineering, 66, 220–228.

Chicago

Kaihua Cui, Zhang Hui, Huang Xiaojin, Yue Xiaobin, Liu Qian, and Li Lulu. 2020. “Vibration-Resistant Interference Microscope with Assistant Focusing for on-Machine Measurement of Surface Topography.” Precision Engineering 66 (November): 220–28. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........3edb7a420e6abc6b368e596a2001f218&authtype=sso&custid=ns315887.