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Analytic sampling-circuit model

Authors :
D.F. Williams
Kate A. Remley
Source :
IEEE Transactions on Microwave Theory and Techniques. 49:1013-1019
Publication Year :
2001
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2001.

Abstract

We develop analytic expressions for the impulse response and kickout pulses of a simple sampling circuit that incorporate the nonlinear junction capacitance of the sampling diode. We examine the effects of both the time-varying junction capacitance and conductance on the impulse response and kickout pulses, and discuss their impact on the accuracy of the nose-to-nose calibration technique.

Details

ISSN :
15579670 and 00189480
Volume :
49
Database :
OpenAIRE
Journal :
IEEE Transactions on Microwave Theory and Techniques
Accession number :
edsair.doi...........3e447fc132714e1486210c4706f5135a