An efficient power routing technique to resolve the current crowding effect in the power grid structure of gate arrays

This paper is the first report on the detrimental current crowding effect in the power grid structure of gate arrays. Innovative solutions to the problems are described. The proposed power routing technique utilizes flexible metalization with respect to the power pad locations. The resulting structure improves gate utilization and prevents metal electromigration. The CAD physical design flow for implementation in a 0.5 /spl mu/m CMOS sea-of-gate array is described. >