Cite
Infrared Imaging and a New Interpretation on the Reverse Contrast Images in GaAs Wafer
MLA
Seong Jun Kang. “Infrared Imaging and a New Interpretation on the Reverse Contrast Images in GaAs Wafer.” Journal of the Korea Institute of Information and Communication Engineering, vol. 20, Nov. 2016, pp. 2085–92. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........3d8e3dd83864f7da7219e000a3ed5b8b&authtype=sso&custid=ns315887.
APA
Seong Jun Kang. (2016). Infrared Imaging and a New Interpretation on the Reverse Contrast Images in GaAs Wafer. Journal of the Korea Institute of Information and Communication Engineering, 20, 2085–2092.
Chicago
Seong Jun Kang. 2016. “Infrared Imaging and a New Interpretation on the Reverse Contrast Images in GaAs Wafer.” Journal of the Korea Institute of Information and Communication Engineering 20 (November): 2085–92. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........3d8e3dd83864f7da7219e000a3ed5b8b&authtype=sso&custid=ns315887.