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Simultaneous Measurement for Thickness and P Content of an Electroless Ni/Au Plating Film on Printed Circuit Board by XRF Spectrometry
- Source :
- BUNSEKI KAGAKU. 69:515-520
- Publication Year :
- 2020
- Publisher :
- Japan Society for Analytical Chemistry, 2020.
Details
- ISSN :
- 05251931
- Volume :
- 69
- Database :
- OpenAIRE
- Journal :
- BUNSEKI KAGAKU
- Accession number :
- edsair.doi...........3d4ec71111a196843f10c53f2b06acbf
- Full Text :
- https://doi.org/10.2116/bunsekikagaku.69.515