A Fault-Tolerant Area-Efficient Current-Mode ADC for Multiple-Valued Neural Networks

In this paper a new expandable current-mode Analog to Digital Conversion method is proposed for multiple-valued neural networks. The proposed method employs a semi-parallel architecture of current comparators to reduce the conversion time. A feedback path is used to regulate the outputs of the comparators and prevent the possible errors in the reference currents to propagate to the outputs. The circuits for a sample 4-bit conversion are designed and simulated in CMOS 180nm technology from TSMC with a 1.8v power supply.