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Fringing Field Effects in Ferroelectric Negative Capacitance Field-Effect Transistors
- Source :
- Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials.
- Publication Year :
- 2017
- Publisher :
- The Japan Society of Applied Physics, 2017.
Details
- Database :
- OpenAIRE
- Journal :
- Extended Abstracts of the 2017 International Conference on Solid State Devices and Materials
- Accession number :
- edsair.doi...........3c729dc579426598b82b6b71872a8667
- Full Text :
- https://doi.org/10.7567/ssdm.2017.e-4-03