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Phase-to-phase perovskite growth transformation in thin PZT films

Authors :
I. P. Pronin
E. Yu. Kaptelov
V. P. Pronin
T. A. Shaplygina
S. V. Senkevich
V. A. Klimov
Source :
Bulletin of the Russian Academy of Sciences: Physics. 74:1304-1306
Publication Year :
2010
Publisher :
Allerton Press, 2010.

Abstract

The structure and dielectric properties of thin lead zirconate titanate films grown ex situ on Pt/SiO2/Si substrates were studied. It was shown that with a crystallization temperature increase in the range of 540 to 580°C, the mechanism of perovskite phase growth changes and the ferroelectric parameters change according to this transformation.

Subjects

Subjects :
Crystallization temperature
chemistry.chemical_compound
Materials science
chemistry
Chemical engineering
Phase (matter)
General Physics and Astronomy
Dielectric
Lead zirconate titanate
Ferroelectricity
Growth transformation
Perovskite (structure)

Details

ISSN :
19349432 and 10628738
Volume :
74
Database :
OpenAIRE
Journal :
Bulletin of the Russian Academy of Sciences: Physics
Accession number :
edsair.doi...........3c34f5b624417adb0a0cddee8cc3026b
Full Text :
https://doi.org/10.3103/s1062873810090340
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