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Soft error rate analysis based on multiple sensitive volume model using PHITS
- Source :
- Journal of Nuclear Science and Technology. 53:451-458
- Publication Year :
- 2015
- Publisher :
- Informa UK Limited, 2015.
-
Abstract
- Secondary cosmic-ray neutron-induced soft errors in an n-type metal-oxide-semiconductor field-effect transistor are analyzed based on the multiple sensitive volume (MSV) model using Particle and He...
- Subjects :
- 010302 applied physics
Physics
Nuclear and High Energy Physics
010308 nuclear & particles physics
Astrophysics::High Energy Astrophysical Phenomena
Transistor
Semiconductor device
Condensed Matter::Mesoscopic Systems and Quantum Hall Effect
01 natural sciences
Radiation effect
Computational physics
law.invention
Soft error
Nuclear Energy and Engineering
Volume (thermodynamics)
Single event upset
law
0103 physical sciences
Particle
Neutron
Subjects
Details
- ISSN :
- 18811248 and 00223131
- Volume :
- 53
- Database :
- OpenAIRE
- Journal :
- Journal of Nuclear Science and Technology
- Accession number :
- edsair.doi...........3bfd90e68d7b46b378df23d07371e2b4
- Full Text :
- https://doi.org/10.1080/00223131.2015.1056561