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Preparation and characterization of well-ordered, thin niobia films on a metal substrate

Authors :
Sh. K. Shaikhutdinov
Hans-Joachim Freund
J. Middeke
T. Kluener
S. Guimond
A. Uhl
D. Lahav
Ralf-Peter Blum
Fabiana M.T. Mendes
Horst Niehus
Martin Schmal
Helmut Kuhlenbeck
David E. Starr
Source :
Surface Science. 599:14-26
Publication Year :
2005
Publisher :
Elsevier BV, 2005.

Abstract

Combining low energy electron diffraction, scanning tunneling microscopy, angular resolved photoelectron spectroscopy using synchrotron radiation and density functional theory calculations, we have studied the structure of thin niobia films grown on a Cu 3 Au(1 0 0) substrate. Nb deposition onto oxygen implanted Cu 3 Au(1 0 0) and subsequent oxidation results in a flat, well-ordered thin niobia film of hexagonal symmetry. The results suggest that the film consists of 2/3 ML of Nb between two hexagonal O-layers, where Nb 5+ cations occupy the threefold hollow sites. This leads to a ( 3 × 3 ) R 30° structure with respect to the underlying close packed O layer, which in turn forms a (2 × 7) coincidence structure with the metal substrate. The defect structure includes reflection domain boundaries and vacancies.

Details

ISSN :
00396028
Volume :
599
Database :
OpenAIRE
Journal :
Surface Science
Accession number :
edsair.doi...........3bf5fdf6705adbab86c8e886f69a8189
Full Text :
https://doi.org/10.1016/j.susc.2005.09.033