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Preparation and characterization of well-ordered, thin niobia films on a metal substrate
- Source :
- Surface Science. 599:14-26
- Publication Year :
- 2005
- Publisher :
- Elsevier BV, 2005.
-
Abstract
- Combining low energy electron diffraction, scanning tunneling microscopy, angular resolved photoelectron spectroscopy using synchrotron radiation and density functional theory calculations, we have studied the structure of thin niobia films grown on a Cu 3 Au(1 0 0) substrate. Nb deposition onto oxygen implanted Cu 3 Au(1 0 0) and subsequent oxidation results in a flat, well-ordered thin niobia film of hexagonal symmetry. The results suggest that the film consists of 2/3 ML of Nb between two hexagonal O-layers, where Nb 5+ cations occupy the threefold hollow sites. This leads to a ( 3 × 3 ) R 30° structure with respect to the underlying close packed O layer, which in turn forms a (2 × 7) coincidence structure with the metal substrate. The defect structure includes reflection domain boundaries and vacancies.
- Subjects :
- Low-energy electron diffraction
Chemistry
Analytical chemistry
Surfaces and Interfaces
Substrate (electronics)
Condensed Matter Physics
Epitaxy
Surfaces, Coatings and Films
law.invention
Crystallography
X-ray photoelectron spectroscopy
law
Materials Chemistry
Density functional theory
Thin film
Scanning tunneling microscope
Layer (electronics)
Subjects
Details
- ISSN :
- 00396028
- Volume :
- 599
- Database :
- OpenAIRE
- Journal :
- Surface Science
- Accession number :
- edsair.doi...........3bf5fdf6705adbab86c8e886f69a8189
- Full Text :
- https://doi.org/10.1016/j.susc.2005.09.033