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Characteristics of Diamond SBD’s Fabricated on Half Inch Size CVD Wafer Made by the 'Direct Wafer Fabrication Technique'

Authors :
Akiyoshi Chayahara
T. Tsubouchi
Hitoshi Umezawa
Hideaki Yamada
Shinichi Shikata
Yoshiaki Mokuno
Source :
Materials Science Forum. :1227-1230
Publication Year :
2010
Publisher :
Trans Tech Publications, Ltd., 2010.

Abstract

Diamond is a hopeful candidate for power switching device which can operate at high temperature as a “Cooling system free” device, yet at a high current. Recently we have developed a 3D diamond CVD growth method coupled with a sophisticated “direct wafer fabrication technique” to fabricate diamond wafer without slicing. Currently, half inch size single crystal diamond substrates are available for R&D of diamond device. Using this technique, we have increased the device fabrication size from 3x3mm2 to half inch wafer. In this paper, we present the results of measurements on the first device fabricated on a half inch size CVD substrate. We have carried out the first device characteristics mapping for diamond, and have observed the influence of substrate characteristics on the SBD characteristics.

Details

ISSN :
16629752
Database :
OpenAIRE
Journal :
Materials Science Forum
Accession number :
edsair.doi...........3bd47b70c099ca3ae860cc0244e38547
Full Text :
https://doi.org/10.4028/www.scientific.net/msf.645-648.1227