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Secondary ion mass spectrometry with C60+ and Au4004+ projectiles: Depth and nature of secondary ion emission from multilayer assemblies
- Source :
- International Journal of Mass Spectrometry. 269:112-117
- Publication Year :
- 2008
- Publisher :
- Elsevier BV, 2008.
-
Abstract
- Alternating nanometric thin layer films made from poly(diallyldimethylammonium chloride), poly(styrene sulfonate) and montmorillonite clay were analyzed with 26 keV C 60 + (433 eV/atom) and 136 keV Au 400 4+ (340 eV/atom). Secondary ion (SI) emission depth from such thin films was determined to be ∼6–9 nm with C 60 + bombardment. Similar depth of emission was also reported with Au 400 4+ projectile impacts [Z. Li, S.V. Verkhoturov, E.A. Schweikert, Anal. Chem. 78 (2006) 7410]. The SI spectra contain recoiled C 60 projectile constituents ( m / z = 12, 13, 36). They track the compositional variation of the assembled thin layers except for C − and CH − whose abundances appear to correlate with the presence of metal atoms in the topmost layer.
Details
- ISSN :
- 13873806
- Volume :
- 269
- Database :
- OpenAIRE
- Journal :
- International Journal of Mass Spectrometry
- Accession number :
- edsair.doi...........3bbfb65f388324f3ab731ddd48ae605d