Electron yield X ray absorption spectroscopy studies of electrochemically prepared Cu/InP interfaces

Authors :: A. Marbeuf
N. Ollier
J. Vigneron
J.L. Sculfort
A. Etcheberry
G. Tourillon
Source :: Physica B: Condensed Matter. 158:198-199
Publication Year :: 1989
Publisher :: Elsevier BV, 1989.

Subjects :: X-ray absorption spectroscopy
Materials science
Electron yield
Analytical chemistry
Electrical and Electronic Engineering
Atomic physics
Condensed Matter Physics
Electronic, Optical and Magnetic Materials

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