Fowler Nordheim Plot Analysis of Degradation in P3HT:PCBM Thin Film MIM Devices

MLA

Ramesh Kumar, and Vinamrita Singh. “Fowler Nordheim Plot Analysis of Degradation in P3HT:PCBM Thin Film MIM Devices.” Macromolecular Research, vol. 27, May 2019, pp. 1045–49. EBSCOhost, widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........3b96d937fb83d4725a1cdb92496b4386&authtype=sso&custid=ns315887.

APA

Ramesh Kumar, & Vinamrita Singh. (2019). Fowler Nordheim Plot Analysis of Degradation in P3HT:PCBM Thin Film MIM Devices. Macromolecular Research, 27, 1045–1049.

Chicago

Ramesh Kumar, and Vinamrita Singh. 2019. “Fowler Nordheim Plot Analysis of Degradation in P3HT:PCBM Thin Film MIM Devices.” Macromolecular Research 27 (May): 1045–49. http://widgets.ebscohost.com/prod/customlink/proxify/proxify.php?count=1&encode=0&proxy=&find_1=&replace_1=&target=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsair&AN=edsair.doi...........3b96d937fb83d4725a1cdb92496b4386&authtype=sso&custid=ns315887.