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Microscopy in solid state science

Authors :
D. D. Perovic
A.L. Bleloch
P. L. Hansen
King-Ning Tu
Y. Murooka
H. Müllejans
C. A. Walsh
F. Cadete Santos Aires
M. G. Walls
A. J. McGibbon
A. Saeed
James H. Paterson
P. J. Fallon
Nigel D. Browning
Jun Yuan
J. Zhao
L. M. Brown
N. A. Stelmashenko
John M. Rodenburg
David W. McComb
P.H. Gaskell
William T. Pike
Andrew D. Maynard
Dennis McMullan
K. W. R. Gilkes
I. A. Rauf
Archie Howie
Source :
Microscopy Research and Technique. 24:299-315
Publication Year :
1993
Publisher :
Wiley, 1993.

Abstract

The Microstructural Physics group at the Cavendish Laboratory is actively involved in a considerable number of research projects which cover a broad range of materials science. In this paper, we describe briefly several such projects, with particular emphasis given to the application of parallel-detection electron energy loss spectroscopy (PEELS) on a scanning transmission electron microscope (STEM) to the analysis of materials such as stainless steels, catalysts, and high temperature superconductors. In addition, we describe a number of related projects that are currently being carried out in the group, particularly those which utilise and develop novel STEM imaging and analytical techniques. © 1993 Wiley-Liss, Inc.

Details

ISSN :
1059910X
Volume :
24
Database :
OpenAIRE
Journal :
Microscopy Research and Technique
Accession number :
edsair.doi...........3b19c589d4192a0fb50cfdff61f5b5d3
Full Text :
https://doi.org/10.1002/jemt.1070240404