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Focused ion beams in future nanoscale probe recording
- Source :
- Nanotechnology. 13:179-184
- Publication Year :
- 2002
- Publisher :
- IOP Publishing, 2002.
-
Abstract
- Focused ion beam (FIB) applications in the field of nanoscale probe recording are explored. A detailed description of how to use FIBs for trimming longitudinal and perpendicular magnetic recording and playback devices to dimensions of less than 100 nm is presented. An experiment was conducted to demonstrate that the magnetoresistive property of a read element, e.g. a giant-magnetoresistive sensor, strongly depends on the focused ion current and the beam accelerating voltage.
- Subjects :
- Materials science
Magnetoresistance
business.industry
Mechanical Engineering
Bioengineering
Nanotechnology
Giant magnetoresistance
Ion current
General Chemistry
Focused ion beam
Acceleration voltage
Ion
Mechanics of Materials
Perpendicular
Optoelectronics
General Materials Science
Electrical and Electronic Engineering
business
Beam (structure)
Subjects
Details
- ISSN :
- 13616528 and 09574484
- Volume :
- 13
- Database :
- OpenAIRE
- Journal :
- Nanotechnology
- Accession number :
- edsair.doi...........36e298218779c84c1a2ad60b962d7f81