TEM characterization of axial CdTe/ZnTe nanowires and simulation of growth by finite element method

Authors :: Slawek Kret
Detlef Klimm
Paweł Dłużewski
Tomasz Wojtowicz
Holm Kirmse
Wolfgang Neumann
Source :: Acta Crystallographica Section A Foundations of Crystallography. 65:s123-s124
Publication Year :: 2009
Publisher :: International Union of Crystallography (IUCr), 2009.

Subjects :: Materials science
Structural Biology
business.industry
Nanowire
Optoelectronics
business
Finite element method
Cadmium telluride photovoltaics
Characterization (materials science)

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