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TEM characterization of axial CdTe/ZnTe nanowires and simulation of growth by finite element method
- Source :
- Acta Crystallographica Section A Foundations of Crystallography. 65:s123-s124
- Publication Year :
- 2009
- Publisher :
- International Union of Crystallography (IUCr), 2009.
Details
- ISSN :
- 01087673
- Volume :
- 65
- Database :
- OpenAIRE
- Journal :
- Acta Crystallographica Section A Foundations of Crystallography
- Accession number :
- edsair.doi...........36dcd734ed22a13a34b358edea28a0fd