Cluster ion emission in the interaction of slow highly charged ions with surfaces

Cluster ion emission from a variety of surfaces upon impact of highly charged ions is investigated by time-of-flight secondary ion mass spectrometry. The yield of cluster ions as a function of cluster size for and surface follow a power law decline with exponent approaching the -2 limit of the ”equilibrium” and ”shock wave” cluster emission models. While the decline of the cluster ion emission with cluster size is an exponential decay for highly oriented pyrolytic graphite upon impact, the decline is more gradual than for impact, such that at the relative cluster yield is 1000 times higher.