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Charge sharing write driver and half‐ pre‐charge 8T SRAM with virtual ground for low‐power write and read operation
- Source :
- IET Circuits, Devices & Systems. 12:94-98
- Publication Year :
- 2017
- Publisher :
- Institution of Engineering and Technology (IET), 2017.
-
Abstract
- A novel write bitline (BL) charge sharing write driver (CSWD) and a half-V DD read BL (RBL) pre-charge scheme is presented for a single-ended 8T static random access memory (SRAM). Before write enable (WE) signal assertion, CSWD equalises the write BLs by allowing their charge sharing. Both write BLs are equalised at the middle value of supply voltage using leakage current compensation block. Afterwards, as WE signal is asserted, CSWD produces the rail-to-rail levels at write BL pair. Charging of a BL from half-V DD to V DD essentially reduces the write dynamic power dissipation by 50%. Half-V DD precharging is used for RBL to achieve low-power read operation. Read port is powered by virtual ground rail to improve the RBL leakages. The authors compare the proposed 8T design (P8T) with conventional 6T (C6T) and 8T (C8T) designs in a 45 nm technology node. Write power dissipation is reduced by 42% and dynamic read power is reduced by more than 39%. Overall leakages are reduced by more than 18% compared with C6T and I on /I off ratio of the RBL is improved by more than two orders of magnitude compared with conventional 8T (C8T).
- Subjects :
- Computer science
020208 electrical & electronic engineering
02 engineering and technology
020202 computer hardware & architecture
Charge sharing
Control and Systems Engineering
Virtual ground
Low-power electronics
Pre-charge
0202 electrical engineering, electronic engineering, information engineering
Electronic engineering
Node (circuits)
Static random-access memory
Electrical and Electronic Engineering
Block (data storage)
Voltage
Subjects
Details
- ISSN :
- 17518598 and 1751858X
- Volume :
- 12
- Database :
- OpenAIRE
- Journal :
- IET Circuits, Devices & Systems
- Accession number :
- edsair.doi...........3673d98a59e3c18b814b44d832919ec5
- Full Text :
- https://doi.org/10.1049/iet-cds.2017.0146