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Advanced analysis techniques

Authors :
Metin Tolan
Source :
X-Ray Scattering from Soft-Matter Thin Films ISBN: 9783540651826
Publication Year :
1999
Publisher :
Springer Berlin Heidelberg, 1999.

Subjects

Subjects :
Total internal reflection
Optics
Materials science
business.industry
Reflectivity measurement
business

Details

ISBN :
978-3-540-65182-6
ISBNs :
9783540651826
Database :
OpenAIRE
Journal :
X-Ray Scattering from Soft-Matter Thin Films ISBN: 9783540651826
Accession number :
edsair.doi...........3672b016e90275df59a42f8cd60da32b

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Authors Abstract Subjects Details