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Minimizing Development Cost With Reliability Goal for Automotive Functional Safety During Design Phase
- Source :
- IEEE Transactions on Reliability. 67:196-211
- Publication Year :
- 2018
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2018.
-
Abstract
- ISO 26262 is a functional safety standard specifically made for automotive systems, in which the automotive safety integrity level (ASIL) is the representation of the criticality level. Recently, most studies have used ASIL decomposition to reduce the development cost of automotive functions. However, these studies have not paid special attention to the problem that the reliability goal may not be satisfied when ASIL decomposition is performed. In this study, we solve the problem of minimizing the development cost of a distributed automotive function while satisfying its reliability goal during the design phase by presenting two heuristic algorithms, reliabilitycalculation of scheme (RCS) and minimizing development cost with reliability goal (MDCRG). We first use RCS to calculate the reliability value of each ASIL decomposition scheme; then, the MDCRG is used to select the scheme with the minimum development cost while satisfying the reliability goal. Real-life benchmark and simulated functions based on real parameter values are used in experiments, and results show the effectiveness of the proposed algorithms.
- Subjects :
- Functional safety
Heuristic (computer science)
Computer science
business.industry
020208 electrical & electronic engineering
Automotive industry
02 engineering and technology
Automotive Safety Integrity Level
020202 computer hardware & architecture
Reliability engineering
0202 electrical engineering, electronic engineering, information engineering
Benchmark (computing)
Decomposition (computer science)
Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Representation (mathematics)
business
Reliability (statistics)
Subjects
Details
- ISSN :
- 15581721 and 00189529
- Volume :
- 67
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Reliability
- Accession number :
- edsair.doi...........3661cfed6ae6395b440f50afb05490cf