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High Resolution Studies of Oxide Multiferroic Interfaces in the Aberration-Corrected STEM
- Source :
- Microscopy and Microanalysis. 23:1592-1593
- Publication Year :
- 2017
- Publisher :
- Oxford University Press (OUP), 2017.
Details
- ISSN :
- 14358115 and 14319276
- Volume :
- 23
- Database :
- OpenAIRE
- Journal :
- Microscopy and Microanalysis
- Accession number :
- edsair.doi...........36501eb44dc225116343c5260355ce5d
- Full Text :
- https://doi.org/10.1017/s1431927617008625