Back to Search Start Over

High Resolution Studies of Oxide Multiferroic Interfaces in the Aberration-Corrected STEM

Details

ISSN :
14358115 and 14319276
Volume :
23
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........36501eb44dc225116343c5260355ce5d
Full Text :
https://doi.org/10.1017/s1431927617008625