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An incremental Bayesian approch to sketch recognition [approach read approach]

Authors :
Xiao-Jun Wang
Shizhong Liao
Jin-Liang Lu
Source :
2005 International Conference on Machine Learning and Cybernetics.
Publication Year :
2005
Publisher :
IEEE, 2005.

Abstract

Sketch recognition is an essential process for sketch understanding. The free drawing style of sketching makes it difficult to build a robust sketch recognition system that can support the imprecision and high variability present in sketch. This paper addresses these problems inherent in sketch recognition in the framework of Bayesian network which can readily represent uncertainty in the recognition process and make inference based on partial evidence. To further improve recognition accuracy, context information is incorporated in the recognition process rather than identifying sketches in isolation. The new framework proposed in this paper offers user more sketching freedom by automatically grouping strokes and recognizing editing gestures as well as over-traced strokes.

Details

Database :
OpenAIRE
Journal :
2005 International Conference on Machine Learning and Cybernetics
Accession number :
edsair.doi...........358f95d94a5d4f1ec707fafd84a7904f
Full Text :
https://doi.org/10.1109/icmlc.2005.1527740