Analysis of relative standard deviation of spectral line intensity and intensity ratio in laser-induced breakdown spectroscopy using CuIn1−xGaxSe2 thin film samples

MLA

Chan-Kyu Kim, et al. “Analysis of Relative Standard Deviation of Spectral Line Intensity and Intensity Ratio in Laser-Induced Breakdown Spectroscopy Using CuIn1−xGaxSe2 Thin Film Samples.” Journal of Analytical Atomic Spectrometry, vol. 30, Jan. 2015, pp. 2107–19. EBSCOhost, https://doi.org/10.1039/c5ja00139k.

APA

Chan-Kyu Kim, Jung-Hwan In, & Sungho Jeong. (2015). Analysis of relative standard deviation of spectral line intensity and intensity ratio in laser-induced breakdown spectroscopy using CuIn1−xGaxSe2 thin film samples. Journal of Analytical Atomic Spectrometry, 30, 2107–2119. https://doi.org/10.1039/c5ja00139k

Chicago

Chan-Kyu Kim, Jung-Hwan In, and Sungho Jeong. 2015. “Analysis of Relative Standard Deviation of Spectral Line Intensity and Intensity Ratio in Laser-Induced Breakdown Spectroscopy Using CuIn1−xGaxSe2 Thin Film Samples.” Journal of Analytical Atomic Spectrometry 30 (January): 2107–19. doi:10.1039/c5ja00139k.