TEM Imaging of Edges and Point Defects in Monolayer Phosphorene

Authors :: Hu Young Jeong
Kwanpyo Kim
Jun-Yeong Yoon
Jinwoo Cheon
Yangjin Lee
Sol Lee
Source :: Microscopy and Microanalysis. 26:2348-2350
Publication Year :: 2020
Publisher :: Oxford University Press (OUP), 2020.

Subjects :: Phosphorene
chemistry.chemical_compound
Materials science
Condensed matter physics
chemistry
Monolayer
Instrumentation
Crystallographic defect

Tools