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A Single-Chip Optical Phased Array in a Wafer-Scale Silicon Photonics/CMOS 3D-Integration Platform

Authors :
Nicholas M. Fahrenkopf
Pavan Bhargava
Seth Kruger
Christopher Baiocco
Michael R. Watts
Taehwan Kim
Christopher V. Poulton
Yukta Timalsina
Jelena Notaros
Erman Timurdogan
Ami Yaacobi
Vladimir Stojanovic
Tat Ngai
Source :
IEEE Journal of Solid-State Circuits. 54:3061-3074
Publication Year :
2019
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2019.

Abstract

With the growing demand for automotive LiDAR and the maturation of silicon photonics platforms, optical phased arrays (OPAs) have emerged as a key technology for solid-state optical beam-steering. In order to meet realistic automotive specifications with OPAs, >500 antenna elements should work reliably under tight power and cost budgets. Existing multi-chip solutions necessitate expensive packaging and assembly to achieve high interconnect density. Even with 2-D monolithic integration, high-voltage drivers to deliver sufficient power to resistive phase shifters typically result in significant overhead in die area and limited power efficiency. In this article, we introduce a single-chip OPA realized through wafer-scale 3-D integration of silicon photonics and CMOS. Flexible and ultra-dense connections with through-oxide vias (TOVs) in our platform resolve the I/O density issue. Moreover, low-voltage L-shaped phase shifters and compact, efficient switch-mode drivers, connected vertically using TOVs, remove wiring/placement overhead and achieve a large active array aperture within a compact die. Our OPA prototype achieves wide-range 2-D steering over 18.5 $^\circ \times $ 16° by leveraging wavelength tuning and phase control, and array scaling up to 125 elements with a large aperture size of $0.5\,\mathrm {mm}\times 0.5\,\mathrm {mm}$ and 0.15 $^\circ \times $ 0.25° beamwidth while consuming 20 mW/element average power. Since our system supports per-element independent phase control, increased sensitivity to process variations in L-shaped shifters is fully compensated by a simple calibration process.

Details

ISSN :
1558173X and 00189200
Volume :
54
Database :
OpenAIRE
Journal :
IEEE Journal of Solid-State Circuits
Accession number :
edsair.doi...........33e267730a2cd00a432788f53afde982