Analysies of the Radiation Caused Characteristics Change in SOI MOSFETS Using Field Shield Isolation

Authors :: Toshiaki Iwamatsu
Yuuichi Hirano
Shigeto Maegawa
Shigenobu Maeda
Yutaro Yamaguchi
Tadashi Nishimura
W. Fernandez
Source :: Extended Abstracts of the 1998 International Conference on Solid State Devices and Materials.
Publication Year :: 1998
Publisher :: The Japan Society of Applied Physics, 1998.

Subjects :: Materials science
Isolation (health care)
Field (physics)
business.industry
Shield
Silicon on insulator
Optoelectronics
Radiation
business

Database :: OpenAIRE
Journal :: Extended Abstracts of the 1998 International Conference on Solid State Devices and Materials
Accession number :: edsair.doi...........32891b768fd6c381c81d053fa2257291

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