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Stress Development during the Reactive Formation of Silicide Films
- Source :
- Defect and Diffusion Forum. :801-812
- Publication Year :
- 2005
- Publisher :
- Trans Tech Publications, Ltd., 2005.
Details
- ISSN :
- 16629507
- Database :
- OpenAIRE
- Journal :
- Defect and Diffusion Forum
- Accession number :
- edsair.doi...........31600df2d1c0fa0c8acac58507879e83