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4 GHz high-power high-efficiency pseudomorphic power HEMT

Authors :
M.Y. Kao
P.M. Smith
P.C. Chao
W.F. Kopp
S.T. Fu
K.H.G. Duh
T. H. Yu
Source :
1993 IEEE MTT-S International Microwave Symposium Digest.
Publication Year :
2002
Publisher :
IEEE, 2002.

Abstract

The power performance of 0.25- mu m*8-mm double recessed GaAs-based pseudomorphic high electron mobility transistors (PHEMTs) at 4 GHz is reported. The 0.25- mu m-gate-length PHEMTs exhibit typical gate-to-drain breakdown voltage of more than 20 V, peak transconductance of 430 mS/mm, and maximum drain current density of 450 mA/mm. When the drain was biased up to 11 V, the device delivered 5.7-W output power with 12.6-dB power gain and 57% power-added efficiency (PAE). The device demonstrates an extremely broad drain bias range for efficient operation. It exhibits a maximum PAE of 72% with an output power of 4.1 W under a V/sub DS/=7 V condition. with 8-V drain bias, when the device was tuned for maximum output power, it delivered 4.3 W of P/sub 2dB/ with 15.4-dB power gain and 66% PAE. >

Details

Database :
OpenAIRE
Journal :
1993 IEEE MTT-S International Microwave Symposium Digest
Accession number :
edsair.doi...........313ed53cdb3b5e0a56d153c05e88ed59
Full Text :
https://doi.org/10.1109/mwsym.1993.276720