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Stability of twist interfacial dislocations in (001) silicon bonded films

Authors :
Noël Magnea
Hubert Moriceau
J L Rouvuére
Frank Fournel
K Rousseau
Source :
Microscopy of Semiconducting Materials 2001 ISBN: 9781351074629
Publication Year :
2018
Publisher :
CRC Press, 2018.

Subjects

Subjects :
Materials science
Silicon
chemistry
chemistry.chemical_element
Twist
Composite material
Stability (probability)

Details

ISBN :
978-1-351-07462-9
ISBNs :
9781351074629
Database :
OpenAIRE
Journal :
Microscopy of Semiconducting Materials 2001 ISBN: 9781351074629
Accession number :
edsair.doi...........310ccc6c5413ed79c8370a95b023a576

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Authors Abstract Subjects Details