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ChemInform Abstract: High-Pressure X-Ray Diffraction Study of ThOS and UOSe by Synchroton Radiation

Authors :
F. Hulliger
E. Gering
M. Gensini
J. S. Olsen
L. Gerward
U. Benedict
Source :
ChemInform. 22
Publication Year :
2010
Publisher :
Wiley, 2010.

Subjects

Subjects :
Chalcogen
law
Chemistry
High pressure
X-ray crystallography
Radiochemistry
Analytical chemistry
General Medicine
Radiation
Synchrotron
law.invention

Details

ISSN :
09317597
Volume :
22
Database :
OpenAIRE
Journal :
ChemInform
Accession number :
edsair.doi...........304476c0f146b07c5bc2e1ad24ac13b2
Full Text :
https://doi.org/10.1002/chin.199144004
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